Wafer cutting process

Wafer cutting process
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Laser Dicing Process

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What ProPowertek can do for you?

⦁ ProPowertek utilizes laser cutting equipment from the internationally renowned DISCO Corporation, offering a variety of cutting services including Laser Dicing and Laser Grooving. Combined with Blade Dicing, these methods provide flexible wafer dicing solutions suitable for thick metals, high-hardness materials, and third-generation compound semiconductor products.

Wafer Dicing Process

機台會有固定時間,週期性的進行機台穩定度的檢測,利用控片分別進行各反應腔(Chamber)的測試,在ICP反應腔中會進行蝕刻率測試,在鋁(Al)、鈦(Ti)、鎳釩(NiV)、銀(Ag)則會分別進行沈積率及均勻性的預測試,確定了機台狀況一如往常的平穩後,產品會依照排程開始進入生產,客戶的晶圓在完成入站檢驗 (IQC) 後,客戶可要求進行沈積前DHF清洗或是直接進入濺鍍機,按照客戶指示之種類及厚度及ICP條件,進行金屬沈積 (Sputtering Deposition),完成金屬沈積後,可依客戶需求進行沈積後之氮氣退火,或是直接進行出站檢驗 (OQC)。

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The Superiority of ProPowertek

▶ All wafer dicing (Die Saw) processes utilize a full suite of fully automated DISCO equipment. We possess both blade dicing and laser cutting machines, with the laser systems providing dicing and laser grooving services.
▶ We flexibly address challenges encountered with different materials during the cutting process, offering various combinations such as Blade Dicing (BD), Laser Dicing (LD), Laser Grooving (LG), Laser Grooving (LG) + Blade Dicing (BD), and Blade Dicing (BD) + Laser Dicing (LD).
▶ ProPowertek is equipped with Automatic Optical Inspection (AOI) systems to provide post-dicing die inspection services. Combined with CP wafer testing, we generate a comprehensive wafer map to assist downstream packaging in selecting good dies.

Case Sharing

Backside copper (Cu) metal silicon wafers processed using blade dicing first, followed by laser dicing.

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OM Image (side-wall inspection)

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SEM Image (side-wall inspection)

Application

⏺︎ Standard wafer dicing, multi-project wafer (MPW) dicing, GaN on Si dicing, laser grooving, and thick metal dicing.